Our offer
If failures or deviations occur in your processes occure, we can support you by performing analytical failure analyses with reliable measurements. Typical services are:
- Analysis of impurities and surface defects using light microscopy/LIBS, electron microscopy with x-ray spectroscopy (SEM-EDX) or photoelectron spectroscopy (XPS)
- Analysis of organic residues/contaminants (lubricants, coolants, etc.) using gas chromatography with mass spectrometry (GC-MS) or infrared spectroscopy (FTIR)
- Analysis of coatings for layer thickness and composition (on cross-sections) using light microscopy / LIBS or SEM-EDX
- Failure analysis - usually using light microscopy and SEM-EDX
- Analysis of material compositions using optical emission spectroscopy (ICP-OES) or SEM-EDX or LIBS
- Testing of technical cleanliness in accordance with ISO 16232 / VDA 19
- Airborne measurements of particulate and/or chemical contaminants.
- Analysis of all kinds of process media for impurities